"Liquid-environment atomic force microscope" Takeshi Fukuma, Keisuke Miyazawa Aug. 28, 2015 (Japanese Application No.:2015-169504)
"Cantilever for scanning probe microscopy and scanning probe microscope" Hitoshi Asakawa, Takeshi Fukuma, Taiki Kobayashi Feb. 21, 2014 (Japanese Application No.:2014-031312)
"Method and instruments for evaluating the corrosion resistance of metals using liquid-environment electric potential measurement technique" Honbo Kyoko, Ohashi Kenya, Ikeda Mitsuharu,Takeshi Fukuma, Naritaka Kobayashi, Shoichiro Ogata Jul. 22, 2013 (PCT/JP2013/069728)
"Signal detection circuit and scanning probe microscope" Takeshi Fukuma, Kazuki Miyata Mar. 28, 2013 (Japanese Application No.:2013-070575)
Oct. 21, 2016 Japanese Patent No.:6025082
Jan. 3, 2017 No. US9535088 B2
“Closed AFM Cell” Takeshi Fukuma, Hitoshi Asakawa, Yukitoshi Katagiri Nov. 15, 2011(Japanese Application No.:2011-249451)
Nov. 15, 2012(PCT/JP2012/007326)
“Potential measurement system and atomic force microscope” Naritaka Kobayashi, Takeshi Fukuma Sep. 12, 2011(Japanese Application No.: 2011-198811)
Sep. 12, 2012(PCT/JP2011/004325)
Sep. 16, 2014 No. US8839461 B2
“Liquid-environment Potential Measurement System and Atomic Force Microscope” Naritaka Kobayashi, Takeshi Fukuma, Hitoshi Asakawa Nov. 05, 2010 (Japanese Application No.: 2010-248744)
Jul. 29, 2011(PCT/JP2011/004325)
Aug. 15, 2014 Japanese Patent No.:5594795
Apr. 08, 2014 No. US8695108 B2
“Cantilever Excitation Device and Scanning Probe Microscopy” Hitoshi Asakawa, Takeshi Fukuma Aug. 06, 2009(Japanese Application No.:2009-183723)
Aug. 06, 2010(PCT/JP2010/004973)
Aug. 01, 2014 Japanese Patent No.:5585965
Aug. 06, 2013 No. US8505111 B2
Jul. 26, 2017 European patent No. 2463665
“Scanning Probe Microscope” Takeshi Fukuma, Yasumasa Ueda Feb. 02, 2009 (Japanese Application No.: 2009-021675)
Jan. 14, 2010(PCT/JP2010/000164)
Jul. 7, 2013 Japanese Patent No.: 5283089
Dec. 25, 2012 No. US8341760 B2
“Scanning Probe Microscopy” Takeshi Fukuma, Yuji Mitani Aug. 28, 2008(Japanese Application No.:2008-219456)
Jul. 16, 2009(PCT/JP2009/003365)
May. 23, 2014 Japanese Patent No.: 5545214
Feb. 26, 2013 No. US8387159 B2
Jan. 26, 2016 Korean Patent No.: 10-1590665
“Scanning Device for Scanning Probe Microscopes” Takeshi Fukuma, Toshio Ando, Yasutaka Okazaki Jun. 04, 2008(Japanese Application No.: P2008-147041)
May. 29, 2009(PCT/JP2009/002381)
May. 17, 2013 Japanese Patent No.: 5268008
Jul. 10, 2012 No. US8217367 B2
“High-Frequency Small Vibration Measurement System” Takeshi Fukuma, Kei Kobayashi, Hirofumi Yamada and Kazumi Matsushige Feb. 03, 2006 Japanese Patent No.: 3765914
“Material Property Measurement Method and Scanning Probe Microscope” Takeshi Fukuma, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige Mar 26, 2003 (Japanese Patent Application No.: P2003-085746)