"Liquid-environment atomic force microscope"	Takeshi Fukuma, Keisuke Miyazawa	Aug. 28, 2015 (Japanese Application No.:2015-169504)
"Cantilever for scanning probe microscopy and scanning probe microscope"	Hitoshi Asakawa, Takeshi Fukuma, Taiki Kobayashi	Feb. 21, 2014 (Japanese Application No.:2014-031312)
"Method and instruments for evaluating the corrosion resistance of metals using liquid-environment electric potential measurement technique"	Honbo Kyoko, Ohashi Kenya, Ikeda Mitsuharu,Takeshi Fukuma, Naritaka Kobayashi, Shoichiro Ogata	Jul. 22, 2013 (PCT/JP2013/069728)
"Signal detection circuit and scanning probe microscope"	Takeshi Fukuma, Kazuki Miyata	Mar. 28, 2013 (Japanese Application No.:2013-070575)
		Oct. 21, 2016	Japanese Patent No.:6025082
		Jan. 3, 2017	No. US9535088 B2
“Closed AFM Cell”	Takeshi Fukuma, Hitoshi Asakawa, Yukitoshi Katagiri	Nov. 15, 2011（Japanese Application No.:2011-249451） Nov. 15, 2012(PCT/JP2012/007326)
“Potential measurement system and atomic force microscope”	Naritaka Kobayashi, Takeshi Fukuma	Sep. 12, 2011（Japanese　Application　No.: 2011-198811) Sep. 12, 2012（PCT/JP2011/004325)
		Sep. 16, 2014	No. US8839461 B2
“Liquid-environment Potential Measurement System and Atomic Force Microscope”	Naritaka Kobayashi, Takeshi Fukuma, Hitoshi Asakawa	Nov. 05, 2010 （Japanese　Application　No.: 2010-248744) Jul. 29, 2011(PCT/JP2011/004325)
		Aug. 15, 2014	Japanese Patent No.:5594795
		Apr. 08, 2014	No. US8695108 B2
“Cantilever Excitation Device and Scanning Probe Microscopy”	Hitoshi Asakawa, Takeshi Fukuma	Aug. 06, 2009(Japanese Application No.:2009-183723) Aug. 06, 2010（PCT/JP2010/004973)
		Aug. 01, 2014	Japanese Patent No.:5585965
		Aug. 06, 2013	No. US8505111 B2
		Jul. 26, 2017	European patent No. 2463665
“Scanning Probe Microscope”	Takeshi Fukuma, Yasumasa Ueda	Feb. 02, 2009 （Japanese　Application　No.: 2009-021675) Jan. 14, 2010(PCT/JP2010/000164）
		Jul. 7, 2013	Japanese Patent No.: 5283089
		Dec. 25, 2012	No. US8341760 B2
		Jan. 3, 2018	European patent No. 2392930
“Scanning Probe Microscopy”	Takeshi Fukuma, Yuji Mitani	Aug. 28, 2008(Japanese Application No.:2008-219456) Jul. 16, 2009(PCT/JP2009/003365）
		May. 23, 2014	Japanese Patent No.: 5545214
		Feb. 26, 2013	No. US8387159 B2
		Jan. 26, 2016	Korean Patent No.: 10-1590665
“Scanning Device for Scanning Probe Microscopes”	Takeshi Fukuma, Toshio Ando, Yasutaka Okazaki	Jun. 04, 2008(Japanese Application No.: P2008-147041) May. 29, 2009（PCT/JP2009/002381)
		May. 17, 2013	Japanese Patent No.: 5268008
		Jul. 10, 2012	No. US8217367 B2
“High-Frequency Small Vibration Measurement System”	Takeshi Fukuma, Kei Kobayashi, Hirofumi Yamada and Kazumi Matsushige	Feb. 03, 2006	Japanese Patent No.: 3764917
“Material Property Measurement Method and Scanning Probe Microscope”	Takeshi Fukuma, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige	Mar 26, 2003 (Japanese Patent Application No.: P2003-085746)