"Liquid-environment atomic force microscope" | Takeshi Fukuma, Keisuke Miyazawa | Aug. 28, 2015 (Japanese Application No.:2015-169504) |
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"Cantilever for scanning probe microscopy and scanning probe microscope" | Hitoshi Asakawa, Takeshi Fukuma, Taiki Kobayashi | Feb. 21, 2014 (Japanese Application No.:2014-031312) |
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"Method and instruments for evaluating the corrosion resistance of metals using liquid-environment electric potential measurement technique" | Honbo Kyoko, Ohashi Kenya, Ikeda Mitsuharu,Takeshi Fukuma, Naritaka Kobayashi, Shoichiro Ogata | Jul. 22, 2013 (PCT/JP2013/069728) |
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"Signal detection circuit and scanning probe microscope" | Takeshi Fukuma, Kazuki Miyata | Mar. 28, 2013 (Japanese Application No.:2013-070575) |
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Oct. 21, 2016 | Japanese Patent No.:6025082 | ||
Jan. 3, 2017 | No. US9535088 B2 | ||
“Closed AFM Cell” | Takeshi Fukuma, Hitoshi Asakawa, Yukitoshi Katagiri | Nov. 15, 2011(Japanese Application No.:2011-249451) Nov. 15, 2012(PCT/JP2012/007326) |
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“Potential measurement system and atomic force microscope” | Naritaka Kobayashi, Takeshi Fukuma | Sep. 12, 2011(Japanese Application No.: 2011-198811) Sep. 12, 2012(PCT/JP2011/004325) |
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Sep. 16, 2014 | No. US8839461 B2 | ||
“Liquid-environment Potential Measurement System and Atomic Force Microscope” | Naritaka Kobayashi, Takeshi Fukuma, Hitoshi Asakawa | Nov. 05, 2010 (Japanese Application No.: 2010-248744) Jul. 29, 2011(PCT/JP2011/004325) |
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Aug. 15, 2014 | Japanese Patent No.:5594795 | ||
Apr. 08, 2014 | No. US8695108 B2 | ||
“Cantilever Excitation Device and Scanning Probe Microscopy” | Hitoshi Asakawa, Takeshi Fukuma | Aug. 06, 2009(Japanese Application No.:2009-183723) Aug. 06, 2010(PCT/JP2010/004973) |
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Aug. 01, 2014 | Japanese Patent No.:5585965 | ||
Aug. 06, 2013 | No. US8505111 B2 | ||
Jul. 26, 2017 | European patent No. 2463665 | ||
“Scanning Probe Microscope” | Takeshi Fukuma, Yasumasa Ueda | Feb. 02, 2009 (Japanese Application No.: 2009-021675) Jan. 14, 2010(PCT/JP2010/000164) |
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Jul. 7, 2013 | Japanese Patent No.: 5283089 | ||
Dec. 25, 2012 | No. US8341760 B2 | ||
Jan. 3, 2018 | European patent No. 2392930 | ||
“Scanning Probe Microscopy” | Takeshi Fukuma, Yuji Mitani | Aug. 28, 2008(Japanese Application No.:2008-219456) Jul. 16, 2009(PCT/JP2009/003365) |
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May. 23, 2014 | Japanese Patent No.: 5545214 | ||
Feb. 26, 2013 | No. US8387159 B2 | ||
Jan. 26, 2016 | Korean Patent No.: 10-1590665 | ||
“Scanning Device for Scanning Probe Microscopes” | Takeshi Fukuma, Toshio Ando, Yasutaka Okazaki | Jun. 04, 2008(Japanese Application No.: P2008-147041) May. 29, 2009(PCT/JP2009/002381) |
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May. 17, 2013 | Japanese Patent No.: 5268008 | ||
Jul. 10, 2012 | No. US8217367 B2 | ||
“High-Frequency Small Vibration Measurement System” | Takeshi Fukuma, Kei Kobayashi, Hirofumi Yamada and Kazumi Matsushige | Feb. 03, 2006 | Japanese Patent No.: 3764917 |
“Material Property Measurement Method and Scanning Probe Microscope” | Takeshi Fukuma, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige | Mar 26, 2003 (Japanese Patent Application No.: P2003-085746) |