Patents

  1. "Scanning probe microscope and its application method for imaging cell surfaces", Takeshi Fukuma, Takehiko Ichikawa
    • Nov. 1, 2019  (Japanese Application No.:2019-199540)
  2. "Instruments and methods for a cleaning wafer", Chikako Takato, Megumi Uno, Shoichi Ogata, Satomi Hamada, Takeshi Fukuma
    • Oct. 4, 2017  (Japanese Application No.:2017-194095)
  3. "Liquid-environment atomic force microscope", Takeshi Fukuma, Keisuke Miyazawa
    • Aug. 28, 2015  (Japanese Application No.:2015-169504)
    • Apr. 16, 2020 Japanese Patent No.:6692088
  4. "Cantilever for scanning probe microscopy and scanning probe microscope", Hitoshi Asakawa, Takeshi Fukuma, Taiki Kobayashi
    • Feb. 21, 2014  (Japanese Application No.:2014-031312)
    • Nov. 17, 2017  Japanese Patent No.:6241999
  5. "Method and instruments for evaluating the corrosion resistance of metals using liquid-environment electric potential measurement technique", Honbo Kyoko, Ohashi Kenya, Ikeda Mitsuharu,Takeshi Fukuma, Naritaka Kobayashi, Shoichiro Ogata
    • Jul. 22, 2013  (Japanese Application No.:2015-528014)
    • Jul. 22, 2013  (PCT/JP2013/069728)
    • Feb. 24, 2017  Japanese Patent No.:6097832
    • Feb. 26, 2019  US10215686
  6. "Signal detection circuit and scanning probe microscope", Takeshi Fukuma, Kazuki Miyata
    • Mar. 4, 2014  (Japanese Application No.:2015-508003)
    • Mar. 4, 2014  (PCT/JP2014/001198)
    • Oct. 21, 2016  Japanese Patent No.:6025082
    • Jan. 3, 2017  No. US9535088
    • Aug. 5, 2020 EP2980590
  7. “Closed AFM Cell”, Takeshi Fukuma, Hitoshi Asakawa, Yukitoshi Katagiri
    • Nov. 15, 2012 (Japanese Application No.:2013-544136)
    • Nov. 15, 2012  (PCT/JP2012/007326)
    • Aug. 12, 2015 Japanese Patent No.:5761675
    • Aug. 18, 2015 US0110093
  8. “Potential measurement system and atomic force microscope”, Takeshi Fukuma, Naritaka Kobayashi
    • Sep. 12, 2012 (Japanese Application No.: 2013-533501)
    • Sep. 12, 2012 (PCT/JP2011/004325)
    • Sep. 16, 2014  No. US8839461
    • Aug. 15, 2014 Japanese Patent No.:5737640
    • Jun. 19, 2019 EP2757380
  9. “Liquid-environment Potential Measurement System and Atomic Force Microscope”, Takeshi Fukuma, Naritaka Kobayashi, Hitoshi Asakawa
    • Jul. 29, 2011  (Japanese Application No.: 2012-541707)
    • Jul. 29, 2011  (PCT/JP2011/004325)
    • Aug. 15, 2014  Japanese Patent No.:5594795
    • Apr. 08, 2014  No. US8695108
  10. “Cantilever Excitation Device and Scanning Probe Microscopy”, Hitoshi Asakawa, Takeshi Fukuma
    • Aug. 06, 2010  (Japanese Application No.: 2011-525807)
    • Aug. 06, 2010  (PCT/JP2010/004973)
    • Aug. 01, 2014  Japanese Patent No.:5585965  
    • Jul. 26, 2017  European patent No. 2463665
    • Jul. 26, 2017  DE60 2010 043937.2
    • Jul. 26, 2017  TR 2463605
  11. “Scanning Probe Microscope”, Takeshi Fukuma, Yasumasa Ueda
    • Jan. 02, 2010  (Japanese Application No.: 2010-548389)
    • Jan. 14, 2010  (PCT/JP2010/000164)
    • Jul. 7, 2013  Japanese Patent No.: 5283089
    • Dec. 25, 2012  No. US8341760
    • Jan. 3, 2018  European patent No. 2392930
    • Jan. 3, 2018  DE60 2010 047778.9
    • Jan. 3, 2018  GB 2392930
  12. “Scanning Probe Microscopy”, Takeshi Fukuma, Yuji Mitani
    • Jul. 16, 2009 (Japanese Application No.: 2010-526510)
    • Jul. 16, 2009 (PCT/JP2009/003365)
    • May. 23, 2014  Japanese Patent No.: 5545214
    • Feb. 26, 2013  No. US8387159
    • Jan. 22, 2020  European patent No.2325657
  13. “Scanning Device for Scanning Probe Microscopes”, Takeshi Fukuma, Toshio Ando, Yasutaka Okazaki
    • May. 29, 2009 (Japanese Application No.: P2010-515753)
    • May. 29, 2009 (PCT/JP2009/002381)
    • May. 17, 2013  Japanese Patent No.: 5268008
    • Jul. 10, 2012  No. US8217367
    • Oct. 15, 2013  CH701011
  14. “High-Frequency Small Vibration Measurement System”, Takeshi Fukuma, Kei Kobayashi, Hirofumi Yamada and Kazumi Matsushige
    • Feb. 03, 2006  Japanese Patent No.: 3764917
  15. “Material Property Measurement Method and Scanning Probe Microscope”, Takeshi Fukuma, Kei Kobayashi, Hirofumi Yamada, Kazumi Matsushige
    • Mar 26, 2003  (Japanese Patent Application No.: P2003-085746)